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专利名称：Voltage Rail Monitoring to Detect
Electromigration
发明人：David D. Cadigan,William V. Huott,Adam J.
McPadden,Anuwat Saetow,Gary A. Tressler
申请号：US150544申请日：20160226
公开号：US201702198A1公开日：20170803
专利附图：
摘要：A method detects electromigration in a field replaceable unit. An integratedcircuit, which is within a field replaceable unit (FRU) in an electronic device, is quiescented.
An isolation power switch applies a test voltage from a field power source to a targetvoltage rail in the integrated circuit. An isolation power switch isolates the target voltagerail from the field power source. A voltage sensor coupled to the target voltage railmeasures a field voltage decay rate for the target voltage rail. A voltage record
comparator logic within the integrated circuit compares the field voltage decay rate to aninitial voltage decay rate for the target voltage rail. In response to a difference betweenthe field voltage decay rate and the initial voltage decay rate for the target voltage railexceeding a predetermined limit, a signal is sent to an output device.
申请人：International Business Machines Corporation
地址：Armonk NY US
国籍：US
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