专利内容由知识产权出版社提供
专利名称：PROCESS FOR THE CONTINUOUS
CONTACTLESS MEASUREMENT OF
OUTLINES AND DEVICE FOR IMPLEMENTINGTHE MEASURING PROCESS
发明人：WIENECKE, Siegfried申请号：EP91920273.0申请日：19911119公开号：EP0511356A1公开日：19921104
摘要： A measuring process continuously without contact profiles, in particularprofiles moving in the axial direction, allows to measure at the inner contours of a profile,provided that they can be achieved by a measuring beam and can reflect the measuringbeam to a receiver. Probes sweep continuously on the principle of triangulation each asurface segment of an object in a specific area assigned to each measuring probe, bymeans of a measurement laser beam, sequentially or timely one after the other, with astep size or resolution variable and pre-adjustable within a measurement area. The beamreflected by the surface of the object and received by a stationary receiver determinesthe form of extent of local data the spacing between each measuring point and theprobe, on the basis of geometric relations. The probes are arranged on a holdingelement which surrounds the profile, at a distance thereof, in predetermined angularpositions with a mutual spacing relative to each other, so that a segment of the profilecontours is assigned to the measurement region of each probe as a surface segment.adjacent probes measuring the areas overlap. A calibration system includes a reference
piece having edges and precise dimensions and can transfer the segments of the contourin a global coordinate system and to assemble them in order to give an image of thewhole.
申请人：Mesacon Gesellschaft für Messtechnik mbH
地址：Martin-Schmeisser-Weg 15 D-44227 Dortmund DE
国籍：DE
代理机构：Patentanwälte Wenzel & Kalkoff
更多信息请下载全文后查看
