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专利名称：Calibration method and apparatus
发明人：Vahe A. Adamian,Michael T. Falcinelli,Peter V.
Phillips
申请号：US08/156277申请日：19931122公开号：US05467021A公开日：19951114
摘要：A multistate electronic transfer standard provides electronic conditions to atleast one of two ports of a vector network analyzer. One embodiment of the multistateelectronic transfer standard includes a plurality of semiconductor interconnected bytransmission lines. Each of the semiconductor devices are biased to generate differentconditions at each of the two ports. A control computer controls the biasing of devicesaccording to a predetermined procedure and compares impedance values measured forat least one of the two ports of the network analyzer to known values stored by thecontrol computer. The control computer thereby derives calibration coefficients that areused by the network analyzer in performing further measurements.
申请人：ATN MICROWAVE, INC.
代理机构：Wolf, Greenfield & Sacks
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