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专利名称：METHOD FOR IDENTIFYING AND
ANALYZING FAULTS/FRACTURES USINGREFLECTED AND DIFFRACTED WAVES
发明人：Alex Berkovitch,Nathan Scharff,Igor Belfer申请号：US12526630申请日：20070312
公开号：US20100131205A1公开日：20100527
专利附图：
摘要：A method for fault and fracture identification based on seismic data
representing a geological section using dispersion properties of reflected and diffracted
waves. The method includes scanning N parameters associated with the seismic data. Thearray includes the coordinate axes of the angle of emergence (β), the radius of curvatureof the wave front (R) and either time or depth samples. The method also includesprocessing the N parameters, generating a new image having a cross-sectional shapeassociated with one of the reflected and diffracted waves, calculating parameters DS andLS, evaluating DS for the case of fracture characterization, and comparing, for the case offault identification, parameter LS with a threshold value defining the type of wave as oneof the reflected and diffracted wave, the cross-sectional shape being substantiallycircular for the reflected wave, and being elliptical for the diffracted wave.
申请人：Alex Berkovitch,Nathan Scharff,Igor Belfer
地址：Barkan IL,Modiin IL,Bat Yam IL
国籍：IL,IL,IL
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