专利内容由知识产权出版社提供
专利名称：VITREOUS SILICA CRUCIBLE AND
DISTORTION-MEASURING APPARATUS FORTHE SAME
发明人：Toshiaki SUDO,Tadahiro SATO,Ken
KITAHARA,Eriko KITAHARA
申请号：US15103609申请日：20141225
公开号：US20160313234A1公开日：20161027
专利附图：
摘要：In an embodiment, a distortion-measuring apparatus for measuring a distortion
distribution of an entire vitreous silica crucible in a non-destructive way includes: a lightsource a first polarizer and a first quarter-wave plate disposed between the light sourceand an outer surface of a vitreous silica crucible wall; a camera disposed inside of avitreous silica crucible a camera control mechanism configured to control a
photographing direction of the camera a second polarizer and a second quarter-waveplate disposed between the camera and an inner surface of the vitreous silica cruciblewall. An optical axis of the second quarter-wave plate inclines 90 degrees with respect tothe first quarter-wave plate
申请人：SUMCO CORPORATION
地址：Minato-ku, Tokyo JP
国籍：JP
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