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专利名称：Method and apparatus for simultaneously
measuring temperature and pressure
发明人：Tomas B. Hirschfeld,Gilbert R. Haugen申请号：US06/6824申请日：19841226公开号：US04768886A公开日：19880906
摘要：Method and apparatus are provided for simultaneously measuring temperatureand pressure in a class of crystalline materials having anisotropic thermal coefficients andhaving a coefficient of linear compression along the crystalline c-axis substantially thesame as those perpendicular thereto. Temperature is determined by monitoring thefluorescence half life of a probe of such crystalline material, e.g., ruby. Pressure isdetermined by monitoring at least one other fluorescent property of the probe thatdepends on pressure and/or temperature, e.g., absolute fluorescent intensity orfrequency shifts of fluorescent emission lines.
申请人：THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
代理人：Stephen C. Macevicz,Henry P. Sartorio
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