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专利名称：Thickness gauge system发明人：LEWIS; DAVID W.申请号：US39219973申请日：19730828公开号：US3866115A公开日：19750211
摘要：A device for monitoring the thickness of films of non-conductive material whilethe film or web is moving, and particularly while the film is still on the calender roll usedin forming the same. The device employs a proximity electronic system. A device ismounted so as to be free to move as the thickness of the film or material passingthereunder varies. It is not necessary that the electronic probe actually contact the film.Oil, air or gasses, etc., which may lie between the probe and the surface of the film haveno affect on the film.
申请人：LEWIS; DAVID W.
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